Mitutoyo Corporation (head office: Takatsu-ku, Kawasaki; president: Kazusaku Tezuka) has developed and commercialized the Hyper MF/MF-U high-precision measuring microscopes. In addition to a major enhancement in operability, the new products have achieved extremely high precision, far exceeding the degree of required precision specified in Class 0 of the related Japanese Industrial Standard (JIS). The new products, which will go on sale on November 21, 2004, will be exhibited at the 22nd Japan International Machine Tool Fair (JIMTOF 2004), which begins on November 1, 2004 at Tokyo Big Sight.
In 2001, Mitutoyo commercialized the MF-A/MF-UA series of measuring microscopes and has since established itself as a manufacturer of optical measuring machines. To meet the demand for non-contact, high-precision measurement, especially in the fields of electronics, semiconductors, information technology, and automobiles, the company has recently developed high-precision measuring microscopes, by integrating its technologies as a comprehensive manufacturer of measuring instruments.
Each of the Hyper MF/MF-U high-precision measuring microscopes uses a no-overhang XY table placed on a high-rigidity base, as well as a low-expansion glass scale. In addition to long strokes measuring 250mm for the X-axis and 150mm for the Y-axis, this has enabled high precision of (0.9+3L/1000) mm and high loading weight of 30kg.
The electric drive for all axes using a joystick has also achieved fine feed capable of positioning at the level of 0.1mm and high-speed feed leading to a maximum of 30mm/sec. Further, by operating the joystick, the stage can be moved freely--even in a diagonal direction--with a high degree of operability.
The Hyper MF-U provides an optional auto-focus function comprising "Tracking Focus" for installing laser auto-focus and "Just Focus" with high repeatability. The result of this is excellent focusing with enhanced operability and repeatability.
For a data processing unit, the QM-Data200 and the Vision unit can be selected as an option. This facilitates efficient high-precision measurement with a precision compensation function and a variety of measurement functions available.
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